Netzsch Technologies India Private Limited
Netzsch Technologies India Private Limited
Mogappair, Chennai, Tamil Nadu
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Thermal Conductivity and Diffusivity Instruments

Thermal Diffusivity and Conductivity LFA / GHP / HFM / TCT

Thermal conductivity and diffusivity are the most important thermophysical material parameters for the description of the heat transport properties of a material or component. For the precise measurement of thermophysical properties like the thermal diffusivity, the Laser Flash technique (LFA) has proven itself as a fast, versatile and precise absolute method. NETZSCH offers three LFA models, covering the entire spectrum of materials and temperatures.

Based on an absolute measurement method, the GHP 456 Titan is the ideal instrument for the determination of thermal conductivity of insulations.

The thermal conductivity as another significant thermophysical property is determined by means of heat flow meters (HFM) with the plate method for insulators, and by means of the hot-wire method (TCT) for dielectric refractories.

NETZSCH instruments fulfill the respective instrument and application standards for LFA (e.g. ASTM E1461, DIN EN 821), for HFM (e.g. ASTM C518, ISO 8301, DIN EN 12667 EN 12, JIS A 1412, based on DIN EN 12664), for TCT (e.g. ISO 8894, ASTM C1113, EN 993-14/15, DIN 51046) and for GHP (ISO 8302, ASTM C177, DIN EN 12939, DIN EN 12667, DIN EN 13163)

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LFA 467 HT HyperFlash
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LFA 467 HT HyperFlash

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Additional Information:
  • Item Code: LFA-467-HT
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LFA 467 HyperFlash Flash Point Apparatus
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LFA 467 HyperFlash Flash Point Apparatus

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LFA 467 HyperFlash® – Light Flash ApparatusNew Dimensions in the Measurement of Thermal Diffusivity and Conductivity – Fast, Simple, Economical

Broadest temperature range available, from -100°C to 500°C
With a single instrument setup – that is, without having to swap out either the detector or the furnace – the LFA 467 HyperFlash® can carry out measurements from -100°C to 500°C. Coupled with the broadest range of accessories available on the market, the instrument opens the door to completely new dimensions in the determination of thermophysical properties.


Sample throughput up to 4 times higher due to sample holder for 16 samples

One unique advantage of the LFA 467 HyperFlash® is its ability to simultaneously measure up to 16 samples over the entire temperature range. This allows for maximum sample throughput with a minimum input of operational time and effort.
Refill systems are available for automatic refilling of the Dewar on both the detector and the furnace, allowing uninterrupted operation of the LFA system around the clock.

ZoomOptics for more precise measurement results without measurement errors
The patented ZoomOptics system (patent no.: DE 10 2012 106 955 B4  2014.04.03) optimizes the field of view of the detector, thus eliminating any influences caused by aperture stops. The result is a significant increase in the precision of the measurement results.


Ultra-fast recording of measurement data for thin samples (2 MHz)

Thin films and high-conductivity materials require a very high data acquisition rate for the precise recording of rapid temperature increases on a sample’s upper surface. The LFA 467 HyperFlash® offers a sampling rate of 2 MHz – an unprecedented value for LFA systems.


        

Key Technical Data(subject to change)
  • Temperature range:
    -100°C to 500°C,
    with only one single furnace
  • Contactless measurement of the temperature increase with IR detector
  • Data acquisition rate:
    up to 2 MHz (for both thermal curve and pulse mapping)
  • Measuring range thermal diffusivity:
    0.01 mm2/s to 1000 mm2/s
  • Measuring range thermal conductivity:
    < 0.1 W/(mK) to 2000 W/(mK)
  • Sample dimensions:
    • 6 mm to 25.4 mm diameter
    • 0.01 mm to 6 mm thickness
  • Patented pulse mapping technique
    for pulse length correction and improved cp determination
  • Compliant to and in accordance with:
    ASTM E1461, ASTM E2585, DIN EN 821-2, DIN 30905, ISO 22007-4, ISO 18755, ISO 13826; DIN EN 1159-2, etc.

Additional Information:
  • Item Code: LFA-467
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Laser Flash Apparatus - 457
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Laser Flash Apparatus - 457

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LFA 457 MicroFlash®Laser Flash Apparatus State-of-the-art technology for thermophysical propertiesThe NETZSCH LFA 457 MicroFlash® complies with the latest technology for modern laser flash systems. The table-top instrument allows measurements from -125°C to 1100°C using two different user-exchangeable furnaces.

The innovative infrared sensor technology employed in the system enables measurement of the temperature increase on the back surface of the sample, even at temperatures of -125°C.

The instrument can be used for small and large sample sizes of up to 25.4 mm diameter and, with the integrated sample changer, measurements can be run on several samples at the same time.

The vacuum-tight design enables tests under defined atmospheres.

The vertical arrangement of the sample holder, furnace and detector simplifies sample placement and, at the same time, guarantees an optimum signal-to-noise ratio of the detector signal.

The LFA 457 MicroFlash® is the most up-to-date and versatile LFA system for research and development and for all applications involving characterization of standard and high-performance materials in automobile manufacturing, aeronautics, astronautics and energy technology.

Key Technical Data(subject to change)
  • Temperature range:
    -125°C to 500°C, RT to 1100°C, (2 exchangeable furnace types)
  • Heating- and cooling rates:
    0.01 K/min to 50 K/min
  • Laser pulse energy:
    up to 18 J/pulse, (adjustable power)
  • Measuring range:
    0.01 mm2/s to 1000 mm2/s (thermal diffusivity)
  • Measuring range:
    0.1 W/mK to 2000 W/mK (thermal conductivity)
  • Sample dimensions:
    10 mm to 25.4 mm diameter (also 8x8 mm and 10x10 mm, square) 0.1 mm to 6 mm thickness
  • Sample holder: SiC, graphite
    Liquid metal holder: sapphire
    Sample holder for liquids: platinum
  • Atmosphere:
    inert, oxidizing, reducing, static, dynamic
  • Vacuum-tight assembly
    up to 10-2 mbar (1 Pa)

Additional Information:
  • Item Code: LFA-457-MicroFlash
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Heat Flow Meter - 446
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Heat Flow Meter - 446

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Product Details:
Minimum Order Quantity1 Piece
BrandNETZSCH
Model446 Lambda Medium
HFM 436 Lambda Heat flow meter
Accurate thermal conductivity testing of insulation materials.

There is enormous potential, especially in the areas of insulation materials and the efficient thermal insulation of residential and commercial buildings. It is thus all the more important for insulating materials to be able to be manufactured with a high and steady level of quality and brought onto the market under strict control of their performance characteristics. 

Enhanced Capabilities

  • Variable external load
  • Integrated printer
  • Extendable to higher conductivity materials with the optional instrumentation kit

Determination of thermal conductivity with the Heat Flow Meter, HFM 436 Lambda, meets the industry standards ASTM C518, ISO 8301, JIS A 1412, DIN EN 12939, DIN EN 13163, DIN EN 12667 and based on DIN EN 12664.

 

Key Technical Data
HFM 436/3/0HFM 436/3/1HFM 436/3/1EHFM 436/6/1
Plate Temperature RangesFixed, 0°C to 40°CVariable, 0°C to 100°CVariable, -30°C to 90°CVariable, -20°C to 70°C
Cooling SystemAirAirExternal ChillerExternal Chiller
Plate Temperature ControlPeltier SystemPeltier SystemPeltier SystemPeltier System
Thermocouple Precision± 0.01°C± 0.01°C± 0.01°C± 0.01°C
Number of Programmable Temperatures1101010
Specimen Size
(L x W x H) mm
305 x 305 x 100305 x 305 x 100305 x 305 x 100610 x 610 x 200
Thermal Resistance Range*0.1 to 8.0 m2⋅K/W;
with instrumentation kit down to 0.05 m2⋅K/W
0.1 to 8.0 m2⋅K/W;
with instrumentation kit down to 0.05 m2⋅K/W
0.1 to 8.0 m2⋅K/W;
with instrumentation kit down to 0.05 m2⋅K/W
0.1 to 8.0 m2⋅K/W
(instrumentation kit not available)
Thermal Conductivity Range*0.002 to 1 W/(m⋅K);
with instrumentation kit up to 2 W/(m⋅K)
0.002 to 1 W/(m⋅K);
with instrumentation kit up to 2 W/(m⋅K)
0.002 to 1 W/(m⋅K);
with instrumentation kit up to 2 W/(m⋅K)
0.002 to 1 W/(m⋅K);
with instrumentation kit up to 2 W/(m⋅K)
Repeatability0.25 %0.25 %0.25 %0.25 %
Accuracy± 1 to 3 %± 1 to 3 %± 1 to 3 %± 1 to 3 %
Dimensions
(L x W x H) mm
480 x 630 x 510480 x 630 x 510480 x 630 x 510800 x 950 x 800
Variable Loadup to 21 kPa (Option)up to 21 kPa (Option)up to 21 kPa (Option)N/A

Instrumentation kit

OptionOptionOptionN/A

Additional Information:
  • Item Code: HFM-436
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Laser Flash Apparatus
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Laser Flash Apparatus

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Owing to the inspiration of our clients, we have started to manufacture a huge range of Laser Flash Apparatus. These tubes are specially designed to meet the requirements of our esteemed clients. Our team of skilled and qualified professionals conduct many tests as per the international standards of quality.

 

The features are:

 

  • Superior quality

  • Optimum service

  • High performance

  • Long service life

  • Robust construction

  • Highly tensile

  • Low maintenance

  • Uniquely designed

  • Easy to operate

  • Low power consumption

 

Other details:

 

  • These machines are used to measure the thermal conductivity of disk shaped samples of ceramic, glass, metal and many more

  • A laser flash technique is currently the most widely accepted method for precise measurement of the thermal diffusivity


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Laser Flash Apparatus LFA 457 MicroFlash
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Laser Flash Apparatus LFA 457 MicroFlash

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Product Details:
Minimum Order Quantity1 Piece
BrandNETZSCH
ModelLFA 457 MicroFlash
UsageIndustrial, Laboratory

We have the required expertise to provide our clients with a wide range of LFA 457 MicroFlash - Laser Flash Apparatus. These products are tested as per the international standards of quality to ensure better tenacity and sturdiness. We can also alter the size of these products as per the specifications and guidelines of the clients.

 

The features are:

  • Accurate pulse length correction, pulse mapping
  • Heat-loss corrections, all literature models are integrated
  • Non-linear regression for Cowan fit
  • Improved Cape-Lehmann model through consideration of multi-dimensional heat loss and non-linear regression
  • Radiation correction for semi-transparent samples
  • 2- or 3-layers systems: analysis by means of non-linear regression and consideration of heat loss
  • Determination of contact resistance in multi-layer systems
  • Model wizard for selecting the optimum evaluation model
  • Determination of specific heat by means of a comparative method and standard samples
  • Integrated databank

Technical Specifications:

  • Temperature range: -125°C ... 500°C, RT ... 1100°C, (2 exchangeable furnace types)

  • Heating- and cooling rates: 0.01 K/min ... 50 K/min

  • Laser pulse energy: up to 18 J/pulse, (adjustable power)

  • Contactless measurement of temperature rise with IR detector

  • Measuring range: 0.01 mm2/s ... 1000 mm2/s (thermal diffusivity)

  • Measuring range: 0.1 W/mK ... 2000 W/mK (thermal conductivity)

  • Sample dimensions: 10 mm ... 25.4 mm diameter (also 8x8 mm and 10x10 mm, square) 0.1 mm ... 6 mm thickness

  • Sample holder: SiC, graphite

  • Liquid metal holder: sapphire

  • Sample holder for liquids: platinum

  • Atmosphere: inert, oxidizing, reducing, static, dynamic

  • Vacuum-tight assembly up to 10-2 mbar (1 Pa)

Application:

  • Polycrystalline Graphite

  • Polycarbonate


Additional Information:
  • Item Code: LFA-457
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LFA 467 HT Hyper Flash Light Flash Apparatus
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LFA 467 HT Hyper Flash Light Flash Apparatus

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Product Details:
Minimum Order Quantity1 Piece
ModelLFA 467 HT HyperFlash
ApplicationLaboratory Use
BrandNETZSCH
UsageIndustrial

Accurate thermal diffusivity and thermal conductivity measurements between RT and 1250°C with Xenon Flash
The LFA 467 HT HyperFlash® is based on the already-established LFA 467 HyperFlash® technology and requires no laser class due to the innovative light source system. The long lifetime of the xenon lamp provides cost-effective measurements until 1250°C without costly consumables. 

The features are:

  • Superior quality

  • Optimum service

  • High performance

  • Long service life

  • Robust construction

  • Highly tensile

  • Low maintenance

  • Uniquely designed

  • Easy to operate

  • Low power consumption

  • Precise dimensions

Technical Specification:

  • Temperature range: RT ... >1250°C

  • Xenon-Flash-Lamp 10 J/pulse, (adjustable power)

  • Contactless measurement of temperature rise with IR detector

  • Measuring range: 0.01 mm2/s ... 2000 mm2/s (thermal diffusivity)

  • Measuring range: < 0.1 W/mK ... 4000 W/mK (thermal conductivity)

  • Sample dimensions: 10 mm ... 25.4 mm diameter (also 8x8 mm and 10x10 mm, square) 0.1 mm ... 3 mm thickness

  • Sample support for 4 samples

  • Sample holder: metal

  • Sample holder for liquids: aluminum / platinum

  • Atmospheres: air, static

  • MTX Scanning device for 50 mm x 50 mm samples (RT), local resolution 0.1 mm


Additional Information:
  • Item Code: LFA-447
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TCT 426 - Thermal Conductivity Tester
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TCT 426 - Thermal Conductivity Tester

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We are regarded by our clients as one of the major manufacturer and supplier of a wide range of TCT 426 - Thermal Conductivity Tester. Various quality checkers conduct multiple tests on these products as per parameters followed globally. Customized range of these products are also manufactured as per the needs of the clients.

 

The features are:

 

  • Superior quality

  • Optimum service

  • High performance

  • Long service life

  • Robust construction

  • Highly tensile

  • Low maintenance

  • Uniquely designed

  • Easy to operate

  • Low power consumption

 

Technical Specification:

 

  • Temperature range: in accordance with ISO 8894-1, ISO 8894-2 from RT ... 1250 °C (higher temperatures up to 1400 °C are possible depending on the material)

  • Chamber-hood furnace with 12 Super-Kanthal heating elements

  • Heating- and cooling rates: 0,01 K/min ... 5 K/min

  • Atmospheres: air, static

  • Hot-wire capacity: 0.1 ... 50 W (continuously adjustable power in 2 zones)

  • Measurement of the temperature increase with differential thermocouples

  • Test piece dimensions: 250 mm x 125 mm x 75 mm (2 test pieces together make up one test assembly)

  • Measuring frame for cross-wire method and parallel-wire method

  • Measuring frame for T(R) technique (optional)


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